10/2014
Electron Optica’s paper entitled “A novel low energy electron microscope for DNA sequencing and surface analysis”has been published in Ultramicroscopy (Vol.145), October 2014. A link may be found here.
9/2014
Electron Optica’s papers entitled “Electron Optics for a Monochromatic, Aberration-Corrected, Dual-Beam Low Energy Electron Microscope” (MADLEEM.pdf), and “Electron Mirror Pulse Compression for Ultrafast Electron Diffraction and Dynamic Electron Microscopy” (Pulse Compressor.pdf) have been accepted as oral presentations at the 9th International conference on Charged Particle Optics (CPO9), held in Brno, Czech Republic from September 1- 5, 2014. A brief excerpt of a concert in the Katerinska cave can be seen here (Rusalka_short - Wi-Fi.m4v)...
Electron Optica’s paper entitled “Progress Towards A Monochromatic, Aberration-Corrected, Dual-Beam LEEM (MAD-LEEM)”has been accepted as an poster presentation (LEEM_PEEM-9_abstract.pdf) at the 9th International symposium on LEEM/PEEM (LP9), held in Berlin, Germany from September 14- 18, 2014.
5/20/2014
Electron Optica was granted patent # 8,729,466 entitled“Aberration-corrected and energy-filtered low energy electron microscope with monochromatic dual beam illumination”by the USPTO on May 20, 2014.
10/1/2013
Please check out a review of our progress to date at GenomeWeb|In Sequence.
9/30/2013
Electron Optica’s paper entitled “A monochromatic, aberration-corrected, dual-beam low energy electron microscope ”has been published (Ultramicroscopy 2013.pdf) in Ultramicroscopy (Vol.130), July 2013. A link may be found here.
12/18/2012
Electron Optica was granted patent # 8,334,508 entitled “Mirror energy filter for electron beam apparatus”by the USPTO on December 18, 2012.
10/26/2012
Electron Optica’s paper entitled “Progress Towards An Aberration-Corrected Low Energy Electron Microscope for DNA Sequencing and Surface Analysis”has been published (JVST B 2012.pdf) in the Journal of Vacuum Science & Technology B (Vol.30, Issue 6), 26 October 2012. A link may be found here, and for a review look here.
9/18/2012
Electron Optica will be presenting an invited talk entitled“An Aberration-Corrected Low Energy Electron Microscope for DNA Sequencing and Surface Analysis (MankosetalAbstract.pdf) at the 2012 MRS FAll Meeting (MRS 2012), held in Boston, MA from November 25 - 30, 2012. The paper will be be given on Monday November 26, 2012, in symposium YY on Low-Voltage Electron Microscopy and Spectroscopy for Materials Characterization.
9/18/2012
Electron Optica’s paper entitled “A Monochromatic, Aberration-Corrected, Dual-Beam LEEM”has been accepted as an oral presentation (Electron Optica LP8 abstract.pdf) at the 8th International symposium on LEEM/PEEM (LP8), held in Hong Kong from November 11- 15, 2012.
9/4/2012
Electron Optica was granted patent # 8,258,474 entitled “Compact arrangement for dual-beam low energy electron microscope”by the USPTO on September 4, 2012.
5/22/2012
Electron Optica was granted patent # 8,183,526 entitled “Mirror monochromator for charged particle beam apparatus”by the USPTO on May 22, 2012.
4/18/2012
Electron Optica’s paper entitled “Progress Towards An Aberration-Corrected Low Energy Electron Microscope for DNA Sequencing and Surface Analysis”has been accepted for presentation (Mankosetal_Abstract.pdf) at the 56th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), held in Waikoloa Village, HA from May 29 through June 1st 2012. Electron Optica will be also participating in the 2011 EIPBN Commercial Session, so please come and visit!
8/22/2011
Electron Optica received a grant from the National Human Genome Research Institute (NHGRI), part of the National Institutes of Health (NIH), to develop a novel DNA sequencing technology that is aimed at rapidly sequencing a person’s genome for $1000 or less. Check out the press release, abstract and a feature on NHGRI’s Division of Extramural Research page.
4/18/2011
Electron Optica’s paper entitled “A Novel Low Energy Electron Imaging Technique for DNA Sequencing and Surface Analysis”has been accepted as an oral presentation (Mankos Abstract final.pdf) at the 55th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), held in Las Vegas, NV from May 31 through June 3rd 2011. The paper will be be given on Wednesday June 2nd, 2011, in the section on Emerging Technologies. Electron Optica will be also participating in the 2011 EIPBN Commercial Session, so please come and visit!
12/26/2010
Electron Optica’s first paper entitled “Electron optics for dual-beam low energy electron microscopy”has been published in the journal Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment (a link to the paper is here)
8/18/2010
Marian Mankos presented an invited talk at the 2010 Korea-EU Forum: Nanolithography and nanometrology technology, held in Seoul, Korea from July 21-23 (see news report 1).
5/27/2010
Marian Mankos will be giving an invited talk at the 8th International Conference in Charged Particle Optics, to be held in Singapore from July 12th to 16th, 2010. See you there!